Omni-AD: A Large-scale and Versatile Benchmark for Industrial Anomaly Detection

Dahu shi1,2  Chengshen He3  Shaochen Zhang4  Bo Qian3 
Xiaochen Quan2  Wencong Zhang2*  Xing Wei3
1Zhejiang University2Hikrobot Co., Ltd.3Xi'an Jiaotong University4The Chinese University of HongKong, Shenzhen
*Corresponding Author

Abstract

Industrial Anomaly Detection (IAD) has attracted significant attention and witnessed rapid development. However, the advancement in this field is hindered by two key issues: the performance saturation of existing benchmarks, limiting discriminative evaluation of different IAD methods, and the absence of benchmarks tailored to assess recent multi-modal large language models (MLLMs) in anomaly detection. To this end, we present Omni-AD, a comprehensive IAD benchmark featuring: i) Large scale: The dataset consists of approximately 35K images (6× larger than MVTec AD) with 150 product categories (10× larger than MVTec AD) spanning 16 industrial sectors, delivering unprecedented diversity in terms of both category and image scale compared with existing datasets. ii) Versatility: The benchmark supports both conventional unsupervised and emerging MLLM-based IAD evaluation protocols. The latter is achieved by defining three subtasks of progressive difficulty, with two structured as visual question answering (VQA) and one as visual grounding. iii) Challenge: Extensive experimental results of state-of-the-art methods reveal that the Omni-AD benchmark is more challenging than existing benchmarks, which can drive the future development of the IAD field.

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BibTeX

        
@inproceedings{shi2026omni,
  title={Omni-AD: A Large-scale and Versatile Benchmark for Industrial Anomaly Detection},
  author={Shi, Dahu and He, Chengshen and Zhang, Shaochen and Qian, Bo and Quan, Xiaochen and Zhang, Wencong and Wei, Xing},
  booktitle={Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition},
  pages={14157--14166},
  year={2026}
}